Microscopy Analysis base to Leica confocal - To filament and wire samples

Microscopy Analysis base to Leica confocal - To filament and wire samples

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The support was developed during the work of the student Matheus Cerqueira de Jesus, with guidance from me and Dr. Professor Luis Rogerio de Oliveira Hein. Projects CNPq:168694/2018-2 and Fapesp:2019/14694-0. The mechanism was developed to standardize the roughness analysis of specimens such as filaments and wires. In it, the specimen is elevated (z) and functions as a square, holding it at the base of the Leica DCM-3D microscope.

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